| n
Suitable for Ohmic electrode alloy and anneal for wide-gap
semiconductor (GaN, SiC, et.) |
| n
Use of small-size special high-temperature furnace |
| n
Temperature zone for common use |
|
: 800 - 1200 degree Celsius (MAX1300deg.) |
| n
Distribution of in- plane temperature |
|
: 4 inch wafer in-plane±3
deg.(at 1200 deg.) |
|
(On 0.5mm-thick carbon tray) |
| n
Compatible size of substrate |
|
φ3 - 6 inch |
| n
Wafer conveyance |
|
: Single-wafer processing robot
conveyance (adapted to 25 cassettes) |
| n
Treatment atmosphere |
|
: Inert gas or during decompression |
| n
Standard size of equipment |
|
: 1,000(W)×1,750(D)×1,450(H) |
| n
Weight of equipment |
|
: Approx. 950 kg |